Company Filing History:
Years Active: 2025
Title: Vojtěch Mahel: Innovator in Charged Particle Sensors
Introduction
Vojtěch Mahel is a notable inventor based in Boršice u Blatnice, Czech Republic. He has made significant contributions to the field of charged particle sensors, particularly through his innovative patent. His work focuses on enhancing the capabilities of scanning electron microscopes (SEM) with advanced sensor technology.
Latest Patents
Vojtěch Mahel holds a patent for "Charged particle sensors including wide bandgap materials." This invention encompasses charged particle microscopy systems, sensors, and techniques. The charged particle sensor features a housing designed for integration into a scanning electron microscope. It includes a detector cell that is mechanically coupled with the housing. The detector cell comprises an acceptor layer made of a semiconducting material with a bandgap of at least about 2.0 eV. This layer has a first surface and a second surface opposing it. Additionally, the detector cell contains a first conducting layer on the first surface, a second conducting layer on the second surface, and electrical contacts for both layers.
Career Highlights
Vojtěch Mahel is currently employed at FEI Company, where he continues to develop innovative technologies in the field of microscopy. His expertise in charged particle sensors has positioned him as a key figure in advancing the capabilities of electron microscopy.
Collaborations
Throughout his career, Vojtěch has collaborated with talented individuals such as Branislav Straka and Jan Lásko. These partnerships have contributed to the development of cutting-edge technologies in the field.
Conclusion
Vojtěch Mahel's contributions to charged particle sensor technology exemplify his innovative spirit and dedication to advancing scientific research. His patent and work at FEI Company highlight his role as a significant inventor in the field of microscopy.