Company Filing History:
Years Active: 2023-2025
Title: Vojtech Dolezal: Innovator in Cryo-Charged Particle Sample Handling
Introduction
Vojtech Dolezal is a notable inventor based in Brno, Czech Republic. He has made significant contributions to the field of charged particle microscopy through his innovative work on cryo-sample handling systems. His expertise and dedication to advancing technology have led to the development of a unique patent that enhances the efficiency of cryo-sample storage and transfer.
Latest Patents
Dolezal holds a patent for a "System and method for handling cryo-charged particle samples." This invention relates to a Cryo-Charged Particle (CCP) sample handling and storage system. The system is designed for storing and managing cryo-samples intended for use in charged particle microscopy, particularly in cryo-electron microscopy applications. It includes a storage apparatus for multiple CCP samples and a Charged Particle Apparatus (CPA), such as a cryo-TEM, located remotely from the storage apparatus. Additionally, the system features a transfer device that can be connected to both the storage apparatus and the CPA, facilitating the acquisition and transfer of CCP samples.
Career Highlights
Vojtech Dolezal is currently employed at FEI Company, where he continues to work on innovative solutions in the field of microscopy. His career is marked by a commitment to research and development, contributing to advancements that benefit scientific exploration and analysis.
Collaborations
Dolezal collaborates with esteemed colleagues, including Hans Persoon and John Mitchels. Their combined expertise fosters a productive environment for innovation and development in their respective fields.
Conclusion
Vojtech Dolezal's contributions to cryo-sample handling technology exemplify the impact of innovation in scientific research. His patent and ongoing work at FEI Company highlight the importance of advancements in microscopy and their applications in various scientific disciplines.