Lancaster, United Kingdom

Vladimir Falko

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Quantum Base Limited. Active years: 2019.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Vladimir Falko. Retrieved from https://idiyas.com/inventor/vladimir-falko

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

 

Average Co-Inventor Count = 2.0

ph-index = 1


Company Filing History:


Years Active: 2019

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1 patent (USPTO):Explore Patents

Title: Vladimir Falko - Innovator in Authentication Technology

Introduction

Vladimir Falko is a distinguished inventor based in Lancaster, GB. He is known for his innovative contributions to the field of authentication technology. With a focus on utilizing two-dimensional materials, Falko has developed a unique approach to verifying physical entities.

Latest Patents

Falko holds a patent for an authentication device that comprises one or more flakes of a substantially two-dimensional material. This device is designed to emit electromagnetic radiation through non-resonant photoluminescence, with properties that vary based on the position within the operative area. This innovative technology has the potential to enhance security measures in various applications.

Career Highlights

Vladimir Falko is currently associated with Quantum Base Limited, where he continues to push the boundaries of technology. His work focuses on the intersection of materials science and authentication processes, making significant strides in the industry.

Collaborations

Falko collaborates with Robert James Young, contributing to advancements in their field. Their partnership exemplifies the importance of teamwork in driving innovation.

Conclusion

Vladimir Falko's work in authentication technology showcases his commitment to innovation and excellence. His contributions are paving the way for future advancements in security and verification systems.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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