Dnipro, Ukraine

Vladimir F Utkin

This inventor holds 1 USPTO granted patent. Top assignee: Institut Elektrosvarki Imeni E.o. Patona Akademii Nauk Ukrainskoi Ssr. Active years: 1991.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Vladimir F Utkin. Retrieved from https://idiyas.com/inventor/vladimir-f-utkin

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 8.0

ph-index = 1

Forward Citations = 7(Granted Patents)


Company Filing History:


Years Active: 1991

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1 patent (USPTO):Explore Patents

Title: The Innovations of Vladimir F. Utkin

Introduction

Vladimir F. Utkin is a notable inventor based in Dnipro, Ukraine. He has made significant contributions to the field of acoustic-emission inspection technology. His work has led to the development of innovative solutions that enhance the inspection processes of various articles.

Latest Patents

Vladimir F. Utkin holds a patent for an "Apparatus for acoustic-emission inspection of articles." This invention showcases his expertise in creating advanced inspection technologies that are crucial for ensuring the quality and safety of products.

Career Highlights

Utkin is associated with the Institute of Electric Welding named after E.O. Paton, which is part of the National Academy of Sciences of Ukraine. His role at this prestigious institution has allowed him to engage in cutting-edge research and development in the field of welding and inspection technologies.

Collaborations

Throughout his career, Utkin has collaborated with esteemed colleagues such as Boris E. Paton and Anatoly Y. Nedoseka. These partnerships have fostered a rich environment for innovation and have contributed to the advancement of technology in their respective fields.

Conclusion

Vladimir F. Utkin's contributions to acoustic-emission inspection technology highlight his role as a significant inventor in Ukraine. His work continues to influence the industry and improve inspection methodologies.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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