Marin-Epagnier, Switzerland

Vladimir Dolgovskiy

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Adtran Networks Se. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Vladimir Dolgovskiy. Retrieved from https://idiyas.com/inventor/vladimir-dolgovskiy

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Vladimir Dolgovskiy: Patent Work in Atomic Frequency Control

Introduction

Vladimir Dolgovskiy is an inventor associated with Marin-Epagnier, Switzerland, and Adtran Networks SE. His patent work includes a method for compensating reference-frequency shifts in an atomic-beam system.

Latest Patents

The supplied information lists 1 patent for Dolgovskiy: “Method and Apparatus for Compensating a Reference Frequency Shift.” The invention addresses frequency shifts caused by resonant light interacting with atoms that cross a resonant microwave cavity between light-interaction zones. It toggles the light wavelength between a main and an alternate optical pumping transition while modulating the microwave probe frequency. The system then calculates a wavelength-modulation compensation error signal from measured Ramsey-fringe amplitudes, which can be used to control the probe frequency.

Career Highlights

The provided information associates Dolgovskiy with Adtran Networks SE. His listed patent concerns techniques for improving reference-frequency compensation in atomic systems.

Collaborations

Patrick Berthoud and Manuel Haldimann are identified as Dolgovskiy’s coworkers. The supplied details do not specify their roles in the patent.

Conclusion

Vladimir Dolgovskiy’s listed invention focuses on compensating reference-frequency shifts through coordinated optical and microwave control, as described in his patent.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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