This inventor holds 1 USPTO granted patent. Top assignee: Other. Active years: 2001.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2001
Title: Innovations of Vivek G Badami
Introduction
Vivek G Badami is an accomplished inventor based in Charlotte, NC (US). He has made significant contributions to the field of interferometry, particularly in minimizing cyclic errors in phase measurement systems. His innovative approach has led to advancements that enhance the accuracy of various optical systems.
Latest Patents
Vivek G Badami holds a patent for an "Interferometry system having reduced cyclic errors." This invention features a phase measurement system designed to minimize cyclic errors in the relative phase between exit reference and measurement beams emerging from an interferometer. The system includes a first optical processing channel with a polarizer and detector, as well as a second optical processing channel with a quarter wave retarder, polarizer, and detector. A signal processor processes the signals from both detectors to determine and minimize cyclic errors in the relative phase between the beams. This invention also encompasses interferometry, lithography, and beam writing systems that utilize the phase measurement system to improve the accuracy of interferometric distance measurements.
Career Highlights
Throughout his career, Vivek G Badami has demonstrated a strong commitment to innovation in optical technologies. His work has not only contributed to the scientific community but has also paved the way for practical applications in various industries.
Collaborations
Vivek has collaborated with notable professionals in his field, including Carl A Zanoni and Steven R Patterson. These partnerships have further enriched his research and development efforts.
Conclusion
Vivek G Badami's contributions to the field of interferometry exemplify the impact of innovative thinking in technology. His patent for reducing cyclic errors showcases his dedication to enhancing measurement accuracy in optical systems.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile