Bengaluru, India

Vishwanath S

This inventor holds 1 USPTO granted patent. Top assignee: Texas Instruments Corporation. Active years: 2017.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Vishwanath S. Retrieved from https://idiyas.com/inventor/vishwanath-s

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1


Company Filing History:


Years Active: 2017

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1 patent (USPTO):Explore Patents

Title: Vishwanath S: Innovator in On-Chip Testing Technologies

Introduction

Vishwanath S is a notable inventor based in Bengaluru, India. He has made significant contributions to the field of on-chip testing technologies. His innovative work has led to the development of a patent that enhances the efficiency of field testing methods and apparatus.

Latest Patents

Vishwanath S holds a patent for "On-chip field testing methods and apparatus." This patent discloses various on-chip testers, including a decoder with a test data input and a test stimuli interface. The disclosed on-chip testers also feature a multiplexer with multiple interfaces, including one for automatic test equipment and another for a design-for-testing subsystem. Additionally, the patent describes a memory component that is coupled to the test data input, further enhancing the functionality of the testing apparatus.

Career Highlights

Vishwanath S is currently employed at Texas Instruments Corporation, a leading company in the semiconductor industry. His work at Texas Instruments has allowed him to focus on advancing testing technologies that are crucial for modern electronic devices.

Collaborations

Some of his coworkers include Rahul Gulati and Ratheesh Thekke Veetil. Their collaboration contributes to the innovative environment at Texas Instruments, fostering advancements in technology.

Conclusion

Vishwanath S is a prominent inventor whose work in on-chip testing methods has made a significant impact in the field of electronics. His contributions continue to influence the development of efficient testing technologies.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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