Madison, WI, United States of America

Vishal R Agarwal

This inventor holds 1 USPTO granted patent. Top assignee: Wisconsin Alumni Research Foundation. Active years: 2018.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Vishal R Agarwal. Retrieved from https://idiyas.com/inventor/vishal-r-agarwal

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 2018

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1 patent (USPTO):Explore Patents

Title: Innovations by Vishal R Agarwal

Introduction

Vishal R Agarwal is an accomplished inventor based in Madison, WI (US). He has made significant contributions to the field of motion estimation through his innovative patent. His work focuses on utilizing speckle images to determine object motion in three dimensions.

Latest Patents

Vishal holds a patent titled "Systems, methods and media for determining object motion in three dimensions using speckle images." This patent describes a system that includes a light source, an image sensor, and a hardware processor. The system is designed to emit light toward a scene and capture defocused speckle images at different times. By comparing these images, the system can determine the axial and lateral motion of objects.

Career Highlights

Vishal is associated with the Wisconsin Alumni Research Foundation, where he applies his expertise in motion estimation. His innovative approach has led to advancements in how object motion is analyzed and understood.

Collaborations

Vishal has collaborated with notable colleagues, including Mohit Gupta and Brandon M Smith. Their combined efforts contribute to the ongoing research and development in their field.

Conclusion

Vishal R Agarwal's work exemplifies the intersection of technology and innovation in motion estimation. His contributions continue to influence advancements in this area, showcasing the importance of research and collaboration in driving progress.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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