Bengaluru, India

Vishal Kulshrestha

This inventor holds 1 USPTO granted patent and 4 published patent applications. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Vishal Kulshrestha. Retrieved from https://idiyas.com/inventor/vishal-kulshrestha

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Vishal Kulshrestha: Inventor in Application Quality of Experience

Introduction

Vishal Kulshrestha is an inventor based in Bengaluru, India. His patent work addresses how network traffic data and machine learning can be used to assess application quality of experience.

Latest Patents

Kulshrestha is associated with 1 patent, titled “System and Method for Determining Mean Opinion Score for Application Quality of Experience.” The invention describes a system that collects network traffic flow parameters, extracts features from the data, and trains a machine-learning model to determine a mean opinion score (MOS). A traffic action module then monitors the score and network traffic to assess application quality of experience.

The corresponding method involves collecting network-flow data, extracting a feature set, training and deploying a model to monitor MOS, and determining quality of experience from the resulting score.

Career Highlights

The patent highlights Kulshrestha’s work at the intersection of network monitoring, machine learning, and application performance assessment. Its approach uses measurable network-flow characteristics to support an automated evaluation of users’ experience with applications.

Collaborations

Kulshrestha’s listed coworkers include Swaminathan Srinivasan and Alexander Havang.

Conclusion

Vishal Kulshrestha’s patent presents a machine-learning-based approach to estimating application quality of experience from network traffic, reflecting his contribution to network performance assessment.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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