Seinäjoki, Finland

Visa Panu Pellervo Viertola

This inventor holds 3 USPTO granted patents. Top assignee: Epec Oy. Active years: 2011-2015.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Visa Panu Pellervo Viertola. Retrieved from https://idiyas.com/inventor/visa-panu-pellervo-viertola

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.6

ph-index = 3

Forward Citations = 43(Granted Patents)


Location History:

  • Sienajoki, FI (2011)
  • Seinajoki, FI (2014)
  • Seinäjoki, FI (2015)

Company Filing History:


Years Active: 2011-2015

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3 patents (USPTO):Explore Patents

Title: Visa Panu Pellervo Viertola: Innovator in Data Processing Equipment

Introduction

Visa Panu Pellervo Viertola is a notable inventor based in Seinäjoki, Finland. He has made significant contributions to the field of data processing equipment, holding a total of three patents. His innovative work has positioned him as a key figure in the technology sector.

Latest Patents

Among his latest patents, Visa has developed a display unit and a casing for data processing equipment. These inventions reflect his commitment to enhancing the functionality and design of technological devices.

Career Highlights

Visa currently works at Epec Oy, a company known for its advancements in technology and engineering solutions. His role at Epec Oy allows him to apply his inventive skills in a collaborative environment, driving innovation forward.

Collaborations

Visa has worked alongside talented colleagues such as Arto Orava and Jukka Pekka Antero Ohtonen. Their combined expertise fosters a creative atmosphere that encourages the development of cutting-edge technologies.

Conclusion

Visa Panu Pellervo Viertola is a distinguished inventor whose work in data processing equipment continues to influence the industry. His patents and collaborations highlight his dedication to innovation and excellence.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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