Viraj Sinha

Title: Viraj Sinha and Automated Defect Recognition

Introduction

Viraj Sinha is an inventor based in Long Beach, California, and is associated with Relativity Space, Inc. His patent work addresses automated inspection of radiographic images to identify and assess pore defects in an article.

Latest Patents

Sinha is named on one patent, titled “Automated defect recognition and determinations of pore cluster compliance.” The process obtains a radiographic (RT) image of an article and identifies overlapping portions of that image. It classifies pixels in those portions with a pore classification model, then uses sensor data to generate and map a pore map onto the article. The process identifies regions that exceed rejection thresholds under predefined rules and displays those regions for review. Sinha’s listed patent count is 1 patent.

Career Highlights

Sinha’s patent reflects work on automated defect recognition and pore-cluster compliance. The described approach combines image analysis, sensor data, and rule-based thresholds to help identify regions that may not meet acceptance criteria.

Collaborations

Sinha’s listed coworkers include Christopher Sacco and Kyle Buzza. The available information identifies them as coworkers but does not specify their roles in the patent.

Conclusion

Viraj Sinha’s patent focuses on using radiographic imaging and automated analysis to detect and display potentially noncompliant pore regions, connecting his inventive work with his association with Relativity Space, Inc.