Newark, CA, United States of America

Vincent Yeh

This inventor holds 1 USPTO granted patent. Top assignee: Eyeque Corporation. Active years: 2023.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Vincent Yeh. Retrieved from https://idiyas.com/inventor/vincent-yeh-l1862flp

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 6.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2023

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1 patent (USPTO):Explore Patents

Title: The Innovative Journey of Vincent Yeh

Introduction

Vincent Yeh is a notable inventor based in Newark, CA (US). He has made significant contributions to the field of optical devices, particularly in automated refraction testing. His work is characterized by a commitment to innovation and improving vision care.

Latest Patents

Vincent Yeh holds a patent for a monocular optical device designed for automated refraction testing. This invention aims to enhance the accuracy and efficiency of vision assessments, making it a valuable tool in the field of optometry. He has 1 patent to his name, showcasing his inventive capabilities.

Career Highlights

Vincent is currently employed at Eyeque Corporation, where he continues to develop cutting-edge optical technologies. His role at the company allows him to apply his expertise in creating solutions that address real-world challenges in vision testing.

Collaborations

Vincent collaborates with talented individuals such as Noam Sapiens and David Hishinuma. Their combined efforts contribute to the innovative environment at Eyeque Corporation, fostering advancements in optical technology.

Conclusion

Vincent Yeh's contributions to the field of optical devices exemplify his dedication to innovation and improving vision care. His work at Eyeque Corporation and his patented inventions highlight his role as a significant figure in the industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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