Crawley, Australia

Vincent Patrick Wallace


Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2024

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1 patent (USPTO):Explore Patents

Title: Vincent Patrick Wallace: Innovator in Terahertz Imaging Technology

Introduction

Vincent Patrick Wallace is a notable inventor based in Crawley, Australia. He has made significant contributions to the field of imaging technology, particularly through his innovative methods of analyzing sample materials. His work has implications for various scientific and industrial applications.

Latest Patents

Vincent holds a patent for a method of imaging a sample material. This patent describes a process that involves directing a first radiation to an area of interest within a sample material, utilizing frequencies within the terahertz frequency range. The method includes receiving a first signal that is related to the radiation received from the area of interest, which depends on specific properties of that area. Additionally, the method involves directing a second radiation to the same area, which has a different frequency range, and receiving a second signal related to that radiation. The process also includes scaling or co-registering times of flight associated with both signals to analyze the properties of the sample material effectively.

Career Highlights

Vincent is affiliated with The University of Western Australia, where he continues to advance his research and development in imaging technologies. His work is characterized by a commitment to innovation and a focus on practical applications of his inventions.

Collaborations

Vincent has collaborated with notable colleagues, including Anthony James Fitzgerald and Adam Philip Gibson. These collaborations have further enriched his research and contributed to the advancement of imaging technologies.

Conclusion

Vincent Patrick Wallace is a distinguished inventor whose work in terahertz imaging technology showcases his innovative spirit and dedication to scientific advancement. His contributions are paving the way for new methodologies in material analysis.

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