The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 05, 2024
Filed:
Aug. 28, 2020
The University of Western Australia, Crawley, AU;
Vincent Patrick Wallace, Crawley, AU;
Anthony James Fitzgerald, Crawley, AU;
Adam Philip Gibson, London, GB;
The University of Western Australia, Crawley, AU;
Abstract
The present disclosure provides a method of analyzing an area of interest of a sample material which comprises directing a first radiation to a first area of interest, the first radiation having frequencies within a terahertz frequency range. The method also comprises receiving a first signal THzbeing a quantity related to radiation received from the first area of interest in response to directing the first radiation to the first area of interest, the first signal THzbeing dependent on a first property and on a second property of the first area of interest. Further, the method comprises directing a second radiation to the first area of interest, the second radiation having frequencies within a frequency range that is different to that of the first radiation. In addition, the method comprises receiving a second signal IR1 being a quantity related to radiation received from the first area interest in response to directing the second radiation to the first area of interest, the second signal IR1 being dependent on the second property of the first area of interest. The method also comprises scaling or co-registering times of flight associated with the first signal THzand the second signal IRsuch that the scaled co-registered time of flight corresponds to matching depths within the sample material. Further, the method comprises analyzing the first signal THz1 using the second signal IRto identify first information indicative of the first property of the first area of interest.