Ontario, NY, United States of America

Vincent Lamanna


Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2013

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1 patent (USPTO):Explore Patents

Title: Innovations of Vincent Lamanna

Introduction

Vincent Lamanna is an accomplished inventor based in Ontario, NY (US). He has made significant contributions to the field of scanning technology, particularly through his innovative patent that enhances the scanning of objects. His work is characterized by a blend of creativity and technical expertise.

Latest Patents

Vincent holds a patent for a "Rotational and linear system and methods for scanning of objects." This scanning system features a multi-axis drive module that includes a first linear drive operable along a first axis and a second linear drive that is joined to the first and operable along a second axis that is non-parallel to the first. Additionally, it incorporates a first rotary drive mounted on the second linear drive, which operates around an axis parallel to the first axis. The system is designed to hold the object securely while scanning, utilizing a first optical probe for effective scanning. The rotary fixture may also include a central object-receiving port, allowing for the pressurization of an internal cavity of the object, thereby stabilizing the region to be scanned.

Career Highlights

Vincent is currently employed at Lumetrics, Inc., where he continues to develop and refine innovative scanning technologies. His work at Lumetrics has positioned him as a key player in advancing the capabilities of scanning systems.

Collaborations

Vincent collaborates with talented individuals such as Kyle J Hadcock and Stephen Heveron-Smith, contributing to a dynamic work environment that fosters innovation and creativity.

Conclusion

Vincent Lamanna's contributions to scanning technology through his patent and work at Lumetrics, Inc. highlight his role as a significant inventor in the field. His innovative approaches continue to influence advancements in scanning systems.

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