West Haven, CT, United States of America

Vincent J Russello

This inventor holds 1 USPTO granted patent. Top assignee: Bunker Ramo Corporation. Active years: 1989.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Vincent J Russello. Retrieved from https://idiyas.com/inventor/vincent-j-russello

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 1.0

ph-index = 1

Forward Citations = 38(Granted Patents)


Company Filing History:


Years Active: 1989

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1 patent (USPTO):Explore Patents

Title: Vincent J Russello: Innovator in Computer Peripheral Testing

Introduction

Vincent J Russello is a notable inventor based in West Haven, CT (US). He has made significant contributions to the field of computer technology, particularly in the testing of computer peripherals. His innovative approach has led to the development of a unique apparatus that enhances the efficiency of testing processes.

Latest Patents

Vincent J Russello holds a patent for a "Programmable apparatus and method for testing computer peripherals." This invention provides a portable solution for assessing the condition of computer peripherals. The apparatus is enclosed in a housing and includes a microprocessor, nonvolatile memory, working memory, peripheral connector, data source connector, keyboard, display, and a debuffer routine. This comprehensive design allows users to control the testing process effectively and ensures accurate results.

Career Highlights

Vincent J Russello is associated with Bunker Ramo Corporation, where he has applied his expertise in computer technology. His work at the company has allowed him to further develop his innovative ideas and contribute to advancements in the industry. His patent reflects his commitment to improving the functionality and reliability of computer peripherals.

Collaborations

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Conclusion

Vincent J Russello's contributions to the field of computer peripheral testing exemplify his innovative spirit and dedication to technology. His patent serves as a testament to his skills and vision in enhancing the efficiency of testing processes.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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