Gif-sur-Yvette, France

Vincent Hamm

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignees: Centre National De La Recherche Scientifique, Université Paris-Saclay. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Vincent Hamm. Retrieved from https://idiyas.com/inventor/vincent-hamm

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Vincent Hamm: Innovator in Optical Instrument Positioning

Introduction

Vincent Hamm is a notable inventor based in Gif-sur-Yvette, France. He has made significant contributions to the field of optical instruments, particularly with his innovative designs and methods.

Latest Patents

Vincent Hamm holds a patent for an "Optical instrument positioning device and method." This device is designed for positioning equipment such as a space optical instrument mirror. It includes a platform intended to receive the equipment or form a portion of the equipment, along with six actuating members connected to the platform. Each actuating member features a body that is elastically deformable and a control mechanism that allows for the deformation of the body to modify the position of the platform. He has 1 patent to his name.

Career Highlights

Throughout his career, Vincent Hamm has worked with prestigious institutions such as Université Paris-Saclay and the Centre National de la Recherche Scientifique. His work has been instrumental in advancing the technology related to optical instruments.

Collaborations

Vincent has collaborated with notable individuals in his field, including Mehdi Bouzit and Guillaume Lequertier. Their combined expertise has contributed to the success of various projects.

Conclusion

Vincent Hamm's innovative work in optical instrument positioning showcases his dedication to advancing technology in this specialized field. His contributions are valuable to both academic and practical applications in optical engineering.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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