This inventor holds 2 USPTO granted patents and 1 published patent application and 1 EPO patent. Top assignee: Commissariat a L'energie Atomique Et Aux Energies Alternatives. Active years: 2016-2021.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2016-2021
Title: Vincent Haguet: Innovator in Imaging Systems
Introduction
Vincent Haguet is a notable inventor based in Grenoble, France. He has made significant contributions to the field of imaging systems, particularly in the context of observing well plates. With a total of 2 patents to his name, Haguet's work is characterized by innovative approaches to sample detection and imaging technology.
Latest Patents
Haguet's latest patents include a system for observing a well plate and an imaging system for detecting samples. The first invention relates to a system designed for observing a plate that includes wells. This system features an imaging system comprising microlenses and an associated device for detecting samples. The second patent focuses on an imaging system that includes a matrix of photosensors and a first lamina for supporting the sample. The design incorporates a set of optical elements, including a matrix of microlenses, which enhances the detection capabilities of the system.
Career Highlights
Vincent Haguet is affiliated with the Commissariat à l'Énergie Atomique et aux Énergies Alternatives, where he continues to develop his innovative ideas. His work has been instrumental in advancing imaging technologies that are crucial for various scientific applications.
Collaborations
Haguet has collaborated with notable colleagues such as Nathalie Picolletd'Hahan and François Chatelain. These collaborations have contributed to the development of his patents and the advancement of imaging systems.
Conclusion
Vincent Haguet's contributions to the field of imaging systems demonstrate his commitment to innovation and technology. His patents reflect a deep understanding of the complexities involved in sample detection and imaging, positioning him as a key figure in his field.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
