San Pedro, CA, United States of America

Viktor Yevgenyevich Novozhilov


Average Co-Inventor Count = 5.0

ph-index = 1


Years Active: 2024

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1 patent (USPTO):Explore Patents

Title: Viktor Yevgenyevich Novozhilov: Innovator in RF Technology

Introduction

Viktor Yevgenyevich Novozhilov is a notable inventor based in San Pedro, CA (US). He has made significant contributions to the field of radio frequency (RF) technology, particularly in radar systems. His innovative approach has led to the development of a unique patent that enhances the functionality of RF integrated circuits.

Latest Patents

One of Novozhilov's key patents is titled "Method and apparatus for RF built-in test system for a beamforming module in a radar system." This patent describes an on-chip or built-in self-test (BIST) module for RF integrated circuits (RFICs). The BIST module can be integrated into an RFIC system, which may include a beamforming module of a radar system. It features components and methods that allow for the up-conversion of a signal from a test frequency to RF at the input of the RFIC, as well as the down-conversion and output of the signal. This innovation is crucial for improving the reliability and performance of radar systems.

Career Highlights

Throughout his career, Novozhilov has demonstrated a strong commitment to advancing RF technology. His work has not only contributed to the development of new testing methods but has also paved the way for more efficient radar systems. His patent reflects his expertise and innovative thinking in the field.

Collaborations

Novozhilov has collaborated with talented individuals such as Andrew Bonthron and Wei-Min Kuo. These partnerships have allowed him to enhance his research and development efforts, leading to groundbreaking advancements in RF technology.

Conclusion

Viktor Yevgenyevich Novozhilov is a distinguished inventor whose work in RF technology has made a significant impact on radar systems. His innovative patent showcases his expertise and dedication to improving the reliability of RF integrated circuits.

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