The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 08, 2024
Filed:
May. 06, 2022
Applicant:
Metawave Corporation, Carlsbad, CA (US);
Inventors:
Andrew John Bonthron, Los Angeles, CA (US);
Wei-Min Kuo, Redondo Beach, CA (US);
Viktor Yevgenyevich Novozhilov, San Pedro, CA (US);
Phuoc Thanh Nguyen, Garden Grove, CA (US);
Michael Terry Nilsson, Carlsbad, CA (US);
Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
G01R 31/2896 (2013.01); G01R 31/2865 (2013.01); G01R 31/2868 (2013.01); G01R 31/2882 (2013.01);
Abstract
An on-chip or built-in self-test (BIST) module for an RFIC is provided. The BIST module can be implemented in an RFIC system, which may include a beamforming module of a radar system. The BIST module may include components and methods to up-convert a signal from a test frequency to RF at an input to the RFIC and down-convert and output signal.