Kharkiv, Ukraine

Viktor M Junash

This inventor holds 1 USPTO granted patent. Top assignee: Kharkovsky Aviatsionny Institut. Active years: 1989.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Viktor M Junash. Retrieved from https://idiyas.com/inventor/viktor-m-junash

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 6.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 1989

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1 patent (USPTO):Explore Patents

Title: Viktor M. Junash: Innovator in Thermal Deburring Technology

Introduction: Viktor M. Junash is a distinguished inventor based in Kharkiv, Ukraine, recognized for his contributions to the field of engineering. His innovative approach has resulted in the development of an important patent that enhances manufacturing processes.

Latest Patents: Viktor holds a patent for an "Apparatus for Thermal Deburring of Parts." This invention streamlines the deburring process, offering improved efficiency and quality in the production of various components. The technology is crucial for industries requiring precision workmanship.

Career Highlights: Viktor Junash has made significant strides in his career, primarily associated with the Kharkiv Aviation Institute. His work focuses on developing advanced engineering solutions that cater to both commercial and industrial needs.

Collaborations: Throughout his career, Viktor has collaborated with esteemed colleagues such as Valery P. Bozhko and Sergei Vasilievich Yatsenko. These partnerships have fostered innovative thinking and have contributed to the progression of technology within their field.

Conclusion: Viktor M. Junash stands out as a key figure in the innovation landscape, especially in thermal deburring technology. His dedication to engineering and collaborative efforts continue to inspire advancements in manufacturing processes, ensuring that his contributions will have lasting impacts in the industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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