Charlotte, NC, United States of America

Vikram Vasantha Bhat

This inventor holds 2 USPTO granted patents and 2 EPO patents. Top assignee: Honeywell International Inc.. Active years: 2025-2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Vikram Vasantha Bhat. Retrieved from https://idiyas.com/inventor/vikram-vasantha-bhat-pqhiprwq

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

 

Average Co-Inventor Count = 5.5

ph-index = 1


Company Filing History:


Years Active: 2025-2026

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2 patents (USPTO):Explore Patents

Title: Vikram Vasantha Bhat - Innovator in Radar Technology

Introduction

Vikram Vasantha Bhat is an inventor based in Charlotte, NC (US). He is known for his innovative work in radar technology. His notable patent application focuses on a multi-beam radar-based ground speed sensor utilizing a single radar integrated circuit. This invention aims to enhance the accuracy and efficiency of ground speed measurement.

Latest Patent Applications

Vikram's latest patent application is titled "MULTI-BEAM RADAR BASED GROUND SPEED SENSOR UTILIZING A SINGLE RADAR INTEGRATED CIRCUIT." This application describes an apparatus that includes a single radar integrated circuit designed to generate frequency spectrum data. The signal processing circuitry, which communicates with the radar integrated circuit, consists of at least one processor and memory containing computer-coded instructions. These instructions enable the circuitry to receive feedback frequency spectrum data from multiple directed beams reflecting off an obstructing surface. The system determines ground speed based on the signal measurements of the returning feedback frequency spectrum data.

Conclusion

Vikram Vasantha Bhat is an emerging inventor in the field of radar technology, with a focus on innovative applications that improve ground speed measurement. His work exemplifies the potential of radar technology in various applications.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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