Markham, Canada

Vignesh Vaidhyanathan Seshan

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignees: Advanced Micro Devices Corporation, Ati Technologies Ulc. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Vignesh Vaidhyanathan Seshan. Retrieved from https://idiyas.com/inventor/vignesh-vaidhyanathan-seshan

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Vignesh Vaidhyanathan Seshan: Data Center Error-Reporting Inventor.

Introduction

Vignesh Vaidhyanathan Seshan is an inventor based in Markham, Canada. His work includes a patent addressing how fatal errors in data centers can be reported to both data-plane and control-plane systems.

Latest Patents

Seshan is associated with 1 patent: “Out-of-band error reporting in a data center.” The invention describes circuitry that responds to a fatal-error interrupt by sending information about the error to a data-plane entity and storing separate error information in a location accessible to control-plane circuitry. This allows a system management controller or baseboard management controller to retrieve and relay the stored information independently of recovery actions initiated by the data-plane entity.

Career Highlights

The supplied career information associates Seshan with Advanced Micro Devices Corporation and ATI Technologies ULC. His patent focuses on making fatal-error information available through an out-of-band path, supporting visibility for data-center control systems.

Collaborations

Kabita Rani Saha is identified as a coworker. The available information does not specify the nature of their collaboration.

Conclusion

Vignesh Vaidhyanathan Seshan’s patent contributes an approach to independent error reporting in data centers, connecting data-plane events with control-plane monitoring and management.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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