Bellaire, TX, United States of America

Vigen Ohanian

This inventor holds 1 USPTO granted patent. Top assignee: Pgs Tensor, Inc.. Active years: 2001.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Vigen Ohanian. Retrieved from https://idiyas.com/inventor/vigen-ohanian

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 1.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2001

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1 patent (USPTO):Explore Patents

Title: Vigen Ohanian: Innovator in Migration Systems

Introduction

Vigen Ohanian is a notable inventor based in Bellaire, Texas. He has made significant contributions to the field of migration systems, particularly with his innovative approach to generating zero-offset traces. His work is characterized by a deep understanding of the complexities involved in time-sampled recordings.

Latest Patents

Ohanian holds a patent for a method titled "Migration with Dipping Acquisition Plane System and Method." This invention provides a method for generating a zero-offset trace at a zero-offset location on a processing plane. The method involves reading source and receiver coordinates, determining an ellipsoid based on the source-receiver offset, sampled time, and medium velocity. It further includes calculating normal points on the ellipsoid and determining the zero-offset travel time for each point, ultimately generating a zero-offset trace.

Career Highlights

Vigen Ohanian has dedicated his career to advancing technologies in the field of geophysical exploration. His work at PGS Tensor, Inc. has allowed him to apply his innovative ideas in practical settings, contributing to the efficiency and accuracy of data acquisition methods.

Collaborations

Due to space constraints, the details of collaborations will not be included.

Conclusion

Vigen Ohanian's contributions to the field of migration systems exemplify the impact of innovative thinking in technology. His patent reflects a significant advancement in the generation of zero-offset traces, showcasing his expertise and dedication to the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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