Victor A Scheff

Title: Victor A Scheff: Innovator in Optical Inspection Systems

Introduction

Victor A Scheff is a notable inventor based in Alameda, California, recognized for his contributions to optical inspection systems. With a total of two patents to his name, Scheff has developed innovative technologies that enhance the detection of defects in various materials.

Latest Patents

Scheff's latest patents include an "Inspection system with in-lens, off-axis illuminator" and a "Spatial filter for optically based defect inspection system." The inspection system employs a beam of monochromatic light that travels through a Fourier transform lens before striking a specimen wafer at an angle. This setup produces diffracted light with a broad spatial frequency spectrum, which can be filtered to create a dark field image pattern of defects. The system is optimized to collect spatial frequencies representative of anticipated defect sizes. The spatial filter, on the other hand, is designed to block preselected spatial frequency components, utilizing an array of opaque stripes on a transparent substrate to filter light spots forming a Fourier transform pattern.

Career Highlights

Throughout his career, Victor A Scheff has worked with several companies, including Optical Specialties, Inc. and Insystems, Inc. His work has significantly impacted the field of optical inspection, leading to advancements in defect detection technologies.

Collaborations

Scheff has collaborated with notable individuals in the industry, including Lawrence H Lin and Robert B Howe. These collaborations have contributed to the development of innovative solutions in optical inspection systems.

Conclusion

Victor A Scheff's contributions to the field of optical inspection systems demonstrate his commitment to innovation and excellence. His patents reflect a deep understanding of optical technologies and their applications in defect detection.