Santa Clara, CA, United States of America

Vera Andreeva


Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: Vera Andreeva: Innovator in Deep Learning for Manufacturing

Introduction

Vera Andreeva is a prominent inventor based in Santa Clara, CA, known for her contributions to the field of deep learning and manufacturing. With a focus on enhancing defect detection in high-volume manufacturing processes, her work has significant implications for quality control and efficiency in production.

Latest Patents

Vera holds a patent titled "Ensemble of deep learning models for defect review in high volume manufacturing." This innovative patent outlines methods and systems for detecting defects in images of specimens. The system includes a computer subsystem designed to train an ensemble of deep learning models by adjusting parameters until a pseudo-loss function is approximately equal to but not greater than 0.5. Additionally, the subsystem is capable of detecting defects in runtime specimen images by inputting these images into the trained ensemble, generating labels that indicate whether defects have been detected based on the outputs of the deep learning models.

Career Highlights

Vera Andreeva is currently employed at Kla Corporation, where she applies her expertise in deep learning to improve manufacturing processes. Her work is instrumental in advancing the capabilities of defect detection systems, thereby enhancing the overall quality of manufactured products.

Collaborations

Throughout her career, Vera has collaborated with notable colleagues, including Kuljit Virk and Lawrence Muray. These partnerships have fostered innovation and contributed to the development of cutting-edge technologies in the field.

Conclusion

Vera Andreeva's contributions to deep learning and manufacturing exemplify the impact of innovative thinking in technology. Her patent and work at Kla Corporation highlight her role as a leader in advancing defect detection methodologies.

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