Vadnais Heights, MN, United States of America

Venu Turlapaty

This inventor holds 1 USPTO granted patent. Top assignee: Aetrium, Inc.. Active years: 2000.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Venu Turlapaty. Retrieved from https://idiyas.com/inventor/venu-turlapaty

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 7(Granted Patents)


Company Filing History:


Years Active: 2000

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1 patent (USPTO):Explore Patents

Title: Venu Turlapaty: Innovator in Semiconductor Reliability Testing

Introduction

Venu Turlapaty is a notable inventor based in Vadnais Heights, MN (US). He has made significant contributions to the field of semiconductor reliability testing. His innovative approach has led to the development of a unique testing system that enhances the reliability of semiconductor devices.

Latest Patents

Venu Turlapaty holds a patent for a Modular, Semiconductor Reliability Test System. This system includes an oven designed to perform semiconductor reliability tests. The oven features open axial ends for slideably receiving a board that contains an oven region, which is removably received in the oven. The design ensures that the connection and exterior regions are not heated by the oven, allowing for accurate testing of semiconductor devices.

Career Highlights

Venu Turlapaty is associated with Aetrium, Inc., where he has contributed to advancements in semiconductor testing technologies. His work has been instrumental in improving the efficiency and effectiveness of reliability tests in the semiconductor industry.

Collaborations

Some of his coworkers include Brent Harry and Timothy McMullen, who have collaborated with him on various projects within the company.

Conclusion

Venu Turlapaty is a distinguished inventor whose work in semiconductor reliability testing has made a significant impact on the industry. His innovative patent reflects his commitment to enhancing the reliability of semiconductor devices.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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