Hyderabad Telangana, India

Venkateswara Rao Daliparthi

This inventor holds 1 USPTO granted patent. Top assignee: Bank of America Corporation. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Venkateswara Rao Daliparthi. Retrieved from https://idiyas.com/inventor/venkateswara-rao-daliparthi

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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Average Co-Inventor Count = 1.0

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Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Venkateswara Rao Daliparthi: Inventor in Process Monitoring

Introduction

Venkateswara Rao Daliparthi is an inventor based in Hyderabad, Telangana, India. His work includes a patented system for centralized analysis and monitoring of backend process data. He is associated with Bank of America Corporation.

Latest Patents

Daliparthi’s listed patent is “System and Method for Centralized Analysis and Monitoring of Process Data via Baseline Data Mapping.” The invention retrieves backend processes and stores baseline data indicating the status of enabled processes. It then monitors those processes at predetermined intervals, records their statuses, and compares the monitoring data with the corresponding baseline data. Based on that comparison, the system can generate a report or update a process-status portal. Daliparthi is credited with 1 patent.

Career Highlights

Daliparthi’s patent describes an approach to tracking backend processes through baseline comparisons and centralized reporting. This method is designed to help monitor process status and surface changes through reports or a status portal.

Collaborations

The provided information lists Prabhat Ranjan and Shilpa Banerjee as Daliparthi’s coworkers. Their shared association with Bank of America Corporation provides professional context for his work.

Conclusion

Venkateswara Rao Daliparthi’s listed invention focuses on centralized backend-process monitoring, using baseline data to support status comparisons and reporting.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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