This inventor holds 2 USPTO granted patents and 1 published patent application and 1 EPO patent. Top assignees: National Instruments Corporation, Siemens Aktiengesellschaft. Active years: 2012-2014.
Company Filing History:
1 out of 1,117 
1 out of 30,859 
Years Active: 2012-2014
Title: Venkatesh Bagaria: Innovator in Measurement Technologies
Introduction
Venkatesh Bagaria is a notable inventor based in Bengaluru, India. He has made significant contributions to the field of measurement technologies, particularly through his innovative patents. With a total of two patents to his name, Bagaria has demonstrated a commitment to advancing the capabilities of measurement systems.
Latest Patents
His latest patents include a "Machine vision based automatic maximal clamp measurement tool" and a "System for measurement of three-dimensional motion characteristics." The first patent focuses on a method for measuring distances in an image by detecting curves corresponding to objects and determining a clamp angle based on selected point pairs. The second patent provides a system for measuring the three-dimensional motion of an object using light projection and image processing techniques to create depth maps.
Career Highlights
Throughout his career, Venkatesh Bagaria has worked with prominent companies such as Siemens Aktiengesellschaft and National Instruments Corporation. His experience in these organizations has contributed to his expertise in developing advanced measurement technologies.
Collaborations
Some of his notable coworkers include Varun Akur Venkatesan and Nicolas F Vazquez. Their collaboration has likely fostered an environment of innovation and creativity in their respective projects.
Conclusion
Venkatesh Bagaria's contributions to measurement technologies through his patents and professional experience highlight his role as an influential inventor in the field. His work continues to inspire advancements in measurement systems and methodologies.