Bengaluru, India

Veera Raghava Beri Reddy

This inventor holds 2 USPTO granted patents. Top assignee: Red Hat, Inc.. Active years: 2023-2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Veera Raghava Beri Reddy. Retrieved from https://idiyas.com/inventor/veera-raghava-beri-reddy

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2023-2025

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2 patents (USPTO):Explore Patents

Title: Biography of Veera Raghava Beri Reddy

Introduction: Veera Raghava Beri Reddy is an innovative inventor based in Bengaluru, India. He has made significant contributions to the field of software development, particularly in the area of bug tracking and code classification.

Latest Patents: Veera holds a patent for the "Automated classification of defective code from bug tracking tool data." This patent describes systems and methods for the automated classification of defective code derived from bug tracking tool data. The method involves receiving multiple datasets representing bug reports, vectorizing and clustering source code, and generating supervised feature vectors to train a classification model for detecting new bugs in source code.

Career Highlights: Veera is currently employed at Red Hat, Inc., a leading company in open-source software solutions. His work focuses on enhancing software quality through innovative bug classification techniques.

Collaborations: Throughout his career, Veera has collaborated with notable colleagues, including Srinivasa Bharath Kanta and Pawan Vinayak Dhiran. These collaborations have contributed to the advancement of software development practices.

Conclusion: Veera Raghava Beri Reddy is a prominent figure in the field of software innovation. His patent and work at Red Hat, Inc. reflect his commitment to improving software quality and efficiency.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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