Hooghly, India

Ved Prakash Tanti

This inventor holds 1 USPTO granted patent. Top assignee: Dell Products Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Ved Prakash Tanti. Retrieved from https://idiyas.com/inventor/ved-prakash-tanti

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Ved Prakash Tanti: Inventor in Data Storage

Introduction

Ved Prakash Tanti is an inventor associated with Hooghly, India, and Dell Products Inc. His patent work addresses the detection of missing data segments and the identification of files affected by those gaps in a distributed storage system.

Latest Patents

The provided information lists one patent for Tanti: “Detecting Missing Segments and Identifying Files Impacted by the Missing Segments Using a Single Pass Distributed Scan.” The invention describes partitioning data segments into buckets and assigning buckets to storage nodes. A node identifies child segments associated with its buckets, stores those segments in an LSM tree, and buffers segments intended for another node. After exchanging segments between nodes, the system compares the relevant sets to detect a mismatch.

Career Highlights

Tanti’s listed patent reflects work on distributed data management and storage-system integrity. The method is designed to identify missing segments and determine which files may be affected through a coordinated scan across storage nodes.

Collaborations

The provided information names Srikanth Srinivasan and Chuanbo Jack Zheng as Tanti’s coworkers. It does not specify their roles in the patent or whether they collaborated on this invention.

Conclusion

Ved Prakash Tanti’s listed invention focuses on detecting missing data segments and identifying their impact in distributed storage, highlighting his contribution to data-management technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…