Vasily Cheperanov

Title: Vasily Cheperanov: Innovator in Electronic Component Examination

Introduction

Vasily Cheperanov is a notable inventor based in Juelich, Germany. He has made significant contributions to the field of electronic component examination, particularly in integrated circuits. His innovative methods have paved the way for advancements in the testing and analysis of electronic components.

Latest Patents

Vasily Cheperanov holds a patent for a method for electrically examining electronic components of an integrated circuit. This method involves a target region containing electronic components with contact points and a non-target region. The examination is performed using a combined SEM/AFM nanoprobe, which allows for detailed imaging and analysis. The process includes imaging the non-target region with a scanning electron microscope and subsequently examining the target region with an atomic force microscope. Current/voltage curves are recorded at the contact points, enhancing the understanding of the electronic components' characteristics.

Career Highlights

Vasily Cheperanov is associated with Forschungszentrum Juelich GmbH, where he applies his expertise in electronic component examination. His work has been instrumental in developing methods that improve the reliability and efficiency of electronic testing.

Collaborations

Vasily collaborates with Bert Voigtlaender, contributing to the advancement of research in their field. Their partnership has fostered innovative approaches to electronic component analysis.

Conclusion

Vasily Cheperanov's contributions to the examination of electronic components highlight his role as an innovator in the field. His patented methods and collaborative efforts continue to influence advancements in integrated circuit testing.