Irving, TX, United States of America

Varaha Venkata Ganeswara Pitla

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Citigroup, Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Varaha Venkata Ganeswara Pitla. Retrieved from https://idiyas.com/inventor/varaha-venkata-ganeswara-pitla

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Varaha Venkata Ganeswara Pitla: Software Deployment Innovation.

Introduction

Varaha Venkata Ganeswara Pitla is an inventor based in Irving, Texas, and is associated with Citigroup, Inc. The available information credits Pitla with 1 patent concerning software deployment.

Latest Patents

Pitla’s patent, “Feature management for software deployment,” describes a process for checking software test results before deploying a software package to a user device. The process obtains criteria that include a requirement for a successful test and information identifying where the test status is stored. It then analyzes the status information and deploys the package when the test confirms that the requirement has been met and a deployment request has been received.

Career Highlights

Pitla’s listed invention addresses feature management and deployment controls, using test status as a condition for releasing software to a user device. The provided information associates Pitla with Citigroup, Inc.

Collaborations

The listed coworkers are Adar K. Danait and Ajay Kumar Tumukuntala. The available details identify them as coworkers but do not specify their roles in the patent.

Conclusion

Varaha Venkata Ganeswara Pitla’s patent focuses on making software deployment contingent on verified testing, highlighting a practical approach to managing software releases.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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