Stafford, TX, United States of America

Van Ho

This inventor holds 1 USPTO granted patent. Top assignee: Texas Instruments Corporation. Active years: 2006.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Van Ho. Retrieved from https://idiyas.com/inventor/van-ho

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 16(Granted Patents)


Company Filing History:


Years Active: 2006

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1 patent (USPTO):Explore Patents

Title: Innovations by Van Ho in Embedded Memory Testing

Introduction

Van Ho is an accomplished inventor based in Stafford, TX (US). He has made significant contributions to the field of embedded memory testing, particularly through his innovative patent that addresses the challenges associated with multiple processor cores on a single computer chip. His work is instrumental in enhancing the efficiency and reliability of memory testing processes.

Latest Patents

Van Ho holds a patent titled "Method and apparatus for testing embedded memory on devices with multiple processor cores." This patent describes a method and apparatus that enables the testing of multiple embedded memory arrays associated with multiple processor cores on a single computer chip. The disclosed method identifies specific rows and columns within each embedded memory array that need to be disabled while also activating certain redundant rows and columns. Additionally, it generates a map indicating where memory failures occur in each embedded memory array. The testing process provides signals to external testing devices, indicating whether the embedded memory array is repairable, non-repairable, or free of failures. This innovation significantly reduces memory test time by allowing external devices to determine which data to off-load from each embedded memory array.

Career Highlights

Van Ho is currently employed at Texas Instruments Corporation, where he continues to develop and refine technologies related to embedded memory testing. His expertise in this area has positioned him as a valuable asset to his team and the company as a whole.

Collaborations

Some of Van Ho's notable coworkers include James Michael Jarboe, Jr. and Nathan Weyer Wright. Their collaborative efforts contribute to the advancement of technology in the field of embedded systems.

Conclusion

Van Ho's innovative approach to testing embedded memory has the potential to revolutionize the way memory arrays are evaluated in devices with multiple processor cores. His contributions to the field are noteworthy and demonstrate the importance of innovation in technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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