Anantapur, India

Vamsidhar Reddy Devireddy Venkata

This inventor holds 1 USPTO granted patent. Top assignee: Hewlett Packard Enterprise Development LP. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Vamsidhar Reddy Devireddy Venkata. Retrieved from https://idiyas.com/inventor/vamsidhar-reddy-devireddy-venkata

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Vamsidhar Reddy Devireddy Venkata: Inventor in Machine Learning-Based Cable Detection

Introduction

Vamsidhar Reddy Devireddy Venkata is an inventor associated with Anantapur, India, and Hewlett Packard Enterprise Development LP. His work includes a patent application describing the use of machine learning to identify potential cable problems.

Latest Patents

Venkata is associated with 1 patent, titled “Machine learning-based bad cable detection.” The invention describes systems and techniques that assess performance data to infer a potential bad cable issue. Processing circuitry identifies the cable class and network interface, selects a machine learning model suited to that cable class, and determines a relevant feature set. The model analyzes those features and outputs an indication of a possible cable issue.

Career Highlights

Venkata’s listed patent work focuses on applying machine learning to network diagnostics. The approach is designed to help detect cable problems by analyzing performance data in the context of the cable class and network interface.

Collaborations

His listed coworkers include Pooja Sambhaji Ayanile and Sanjeev Kumar Mishra. The patent is associated with Hewlett Packard Enterprise Development LP.

Conclusion

Vamsidhar Reddy Devireddy Venkata’s patent work highlights a machine-learning approach to identifying potential cable faults and supporting network diagnostics.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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