Villeneuve Loubet, France

Valérie Ehle

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Schneider Electric Industries Sas. Active years: 2021.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Valérie Ehle. Retrieved from https://idiyas.com/inventor/valérie-ehle

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

 

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2021

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1 patent (USPTO):Explore Patents

Title: Valérie Ehle: Innovator in Security Systems

Introduction

Valérie Ehle is a notable inventor based in Villeneuve Loubet, France. He has made significant contributions to the field of security systems, particularly through his innovative patent. His work is recognized for enhancing the safety and functionality of devices.

Latest Patents

Valérie Ehle holds a patent for a "System for securing a device." This security system is designed to be fitted in a device and comprises a command element that can be actuated by an operator to at least a first position and a second position. This invention reflects his commitment to improving device security.

Career Highlights

Ehle is associated with Schneider Electric Industries Sas, a leading company in energy management and automation solutions. His role at Schneider Electric has allowed him to work on cutting-edge technologies that address modern security challenges.

Collaborations

Throughout his career, Valérie has collaborated with talented individuals such as Annick Eyraud and Yannick Buchet. These partnerships have contributed to the development of innovative solutions in the field of security systems.

Conclusion

Valérie Ehle's contributions to security technology through his patent and work at Schneider Electric highlight his role as an influential inventor. His dedication to enhancing device security continues to impact the industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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