Durham, NC, United States of America

Vaibhav Kakkad

This inventor holds 1 USPTO granted patent. Top assignee: Duke University. Active years: 2021.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Vaibhav Kakkad. Retrieved from https://idiyas.com/inventor/vaibhav-kakkad

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 6.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2021

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1 patent (USPTO):Explore Patents

Title: Vaibhav Kakkad: Innovator in Ultrasound Technology

Introduction

Vaibhav Kakkad is a notable inventor based in Durham, NC (US). He has made significant contributions to the field of ultrasound technology, particularly in methods and systems for enhancing imaging acquisition.

Latest Patents

Kakkad holds a patent for "Methods, systems and computer program products for triggering ultrasound data acquisition." This innovative patent outlines methods of triggering an imaging acquisition of a target region in an ultrasound transducer. The process involves acquiring a first type of ultrasound data, analyzing it to identify optimal acquisition times or positions, and generating signals to initiate the acquisition of a second type of ultrasound data. This approach aims to improve the estimated image quality metrics in the target region.

Career Highlights

Vaibhav Kakkad is affiliated with Duke University, where he continues to advance research in ultrasound technology. His work has garnered attention for its potential to enhance medical imaging techniques.

Collaborations

Kakkad collaborates with esteemed colleagues, including David Bradway and Peter J Hollender, contributing to a dynamic research environment.

Conclusion

Vaibhav Kakkad's innovative work in ultrasound technology exemplifies the impact of research and development in medical imaging. His contributions are paving the way for advancements that could significantly improve diagnostic capabilities.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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