This inventor holds 2 USPTO granted patents and 2 EPO patents. Top assignees: Carl Mahr Holding Gmbh, Carl-Zeiss-Stiftung. Active years: 2007-2016.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2007-2016
Title: Uwe Nehse: Innovator in Optical Measurement Technologies
Introduction
Uwe Nehse is a notable inventor based in Geraberg, Germany. He has made significant contributions to the field of optical measurement technologies, holding 2 patents that showcase his innovative approaches to precision measurement.
Latest Patents
Nehse's latest patents include a "Method for optically scanning an edge in or on a surface region." This method involves ascertaining the position of an edge on an object surface by evaluating the reflectivity of the surface region. Light is emitted onto the surface under various illumination conditions, and a sequence of camera images is recorded. Reflectivity images are produced from these camera images, leading to the determination of the edge's position.
Another significant patent is the "Method of optimizing target quantities for optical precision measurement and apparatus therefor." This method focuses on obtaining ancillary parameters from image data of a workpiece to be measured. Control data for influence quantities are derived from these parameters, optimizing the measurement process.
Career Highlights
Throughout his career, Uwe Nehse has worked with esteemed organizations such as Carl Zeiss Stiftung and Carl Mahr Holding GmbH. His experience in these companies has allowed him to refine his skills and contribute to advancements in optical measurement technologies.
Collaborations
Nehse has collaborated with notable professionals in his field, including Gerhard Linss and Olaf Kühn. These collaborations have further enriched his work and expanded the impact of his inventions.
Conclusion
Uwe Nehse's contributions to optical measurement technologies through his patents and collaborations highlight his role as an innovator in the field. His work continues to influence advancements in precision measurement techniques.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
