This inventor holds 1 USPTO granted patent. Top assignee: Agfa-Gevaert. Active years: 2002.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2002
Title: Uwe Ewert: Innovator in Tubular Measurement Technology
Introduction
Uwe Ewert is a notable inventor based in Berlin, Germany. He has made significant contributions to the field of measurement technology, particularly in the assessment of tubular objects. His innovative approach has led to the development of a unique method that enhances the accuracy of wall thickness measurements.
Latest Patents
Uwe Ewert holds a patent for a "Method for measuring the wall thickness of a tubular object." This invention involves obtaining a digital representation of a radiation image of a tubular object. An attenuation profile is taken from the digital image along a straight line across the wall of the object. The attenuation profile is then reflected towards the center of the object, allowing for the reconstruction of a relative density distribution. This is achieved through a transmission tomography-projection reconstruction method, utilizing the measured reflected attenuation profile for all record annular positions.
Career Highlights
Ewert is associated with Agfa-Gevaert, a company known for its advancements in imaging technology. His work at Agfa-Gevaert has allowed him to apply his innovative ideas in a practical setting, contributing to the company's reputation for excellence in imaging solutions.
Collaborations
Throughout his career, Uwe Ewert has collaborated with esteemed colleagues such as Piet Dewaele and Peter M Willems. These partnerships have fostered an environment of innovation and have led to the successful development of new technologies in the field.
Conclusion
Uwe Ewert's contributions to measurement technology, particularly through his patented method for assessing tubular objects, highlight his role as a significant inventor in the industry. His work continues to influence advancements in imaging and measurement techniques.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile