Radeberg, Germany

Uwe Bartheld

This inventor holds 1 USPTO granted patent. Top assignee: Helmholtz-Zentrum Dresden-Rossendorf E.v.. Active years: 2020.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Uwe Bartheld. Retrieved from https://idiyas.com/inventor/uwe-bartheld

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 1.0

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Company Filing History:


Years Active: 2020

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1 patent (USPTO):Explore Patents

Title: Uwe Bartheld: Innovator in Adjusting Devices

Introduction

Uwe Bartheld is a notable inventor based in Radeberg, Germany. He has made significant contributions to the field of adjusting devices, showcasing his innovative spirit through his patented invention.

Latest Patents

Uwe Bartheld holds a patent for an adjusting device designed for spatially adjusting the position of an object. This invention comprises a plurality of plate elements arranged one over the other, featuring radial guide structures that engage with one another at mutually facing sides. The device includes at least one pair of movement plates and a pair of inclination plates arranged on a base. The movement plates maintain a constant thickness, with their upper and lower radial guide structures offset eccentrically. In contrast, the inclination plates have a variable thickness, with their radial guide structures arranged concentrically.

Career Highlights

Uwe Bartheld is associated with the Helmholtz-Zentrum Dresden-Rossendorf e.V., where he continues to contribute to research and development in his field. His work emphasizes the importance of precision and adaptability in engineering solutions.

Collaborations

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Conclusion

Uwe Bartheld's innovative work in adjusting devices highlights his expertise and commitment to advancing technology. His patent reflects a thoughtful approach to engineering challenges, making a significant impact in his field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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