Bengaluru, India

Utkarsh Tekriwal

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: American Express Travel Related Services Company, Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Utkarsh Tekriwal. Retrieved from https://idiyas.com/inventor/utkarsh-tekriwal

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Utkarsh Tekriwal: Inventor in Machine Learning Model Analysis.

Introduction

Utkarsh Tekriwal is an inventor based in Bengaluru, India. His patent work includes a method for analyzing machine learning models and assessing the importance of their features. He is associated with American Express Travel Related Services Company, Inc.

Latest Patents

Tekriwal is named on 1 patent, titled “Machine learning model analysis.” The disclosed approach selects two tuples, each containing a feature vector and a result generated by a machine learning model. It then generates emulated feature vectors, results, and decision instances, and builds a decision tree using the selected tuples and emulated instances. The method computes the importance of each feature in the resulting tree.

Career Highlights

The patent reflects work on interpreting machine learning models through emulated data and decision-tree analysis. This approach is designed to help evaluate how individual features contribute to model decisions.

Collaborations

Tekriwal’s listed coworkers include Lalitha K S and Narayanan Unny Edakunni. His company affiliation connects his patent work with American Express Travel Related Services Company, Inc.

Conclusion

Utkarsh Tekriwal’s patent focuses on analyzing machine learning models and measuring feature importance, highlighting his contribution to methods for understanding model decisions.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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