This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Sap Se. Active years: 2020.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2020
Title: The Innovative Mind of Uta Maria Loesch: Pioneering Multimodal Failure Analysis
Introduction: Uta Maria Loesch, an accomplished inventor based in Ubstadt-Weiher, Germany, has made significant contributions to the field of failure analysis. With a keen focus on developing innovative methodologies, she has secured a patent that showcases her inventive spirit and technical expertise.
Latest Patents: Uta Maria Loesch holds a patent titled "Quantification of Failure Using Multimodal Analysis." This inventive methodology involves receiving a multimodal failure analysis request and determining the asset type based on that request. The process includes obtaining asset records containing data on asset failures across multiple failure modes. The patented model executes a multimodal failure analytical process that calculates failure intervals, probabilities of failure, and intervention scores. Notably, it facilitates the selection of intervention intervals, providing valuable insights in response to analysis requests.
Career Highlights: Uta is associated with SAP SE, where her innovative work thrives in a collaborative environment. Her contributions not only enhance the company’s product offerings but also position her as a leading figure in her field.
Collaborations: Uta collaborates closely with renowned colleagues such as Jaakob Kind and Atreju Florian Tauschinsky. These partnerships have amplified her efforts to drive innovative solutions in failure analysis, showcasing the power of teamwork in advancing technology.
Conclusion: Uta Maria Loesch exemplifies the spirit of innovation through her work in multimodal failure analysis. Her patent exemplifies the blend of creativity and technical skill required to address complex challenges in her industry. As she continues her work at SAP SE, Uta’s contributions will undoubtedly influence the future of failure analysis methodologies.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
