Hombrechtikon, Switzerland

Urs Wuest

This inventor holds 1 USPTO granted patent. Top assignee: Mettler-Toledo Gmbh. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Urs Wuest. Retrieved from https://idiyas.com/inventor/urs-wuest-jhhlwvay

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Urs Wuest and Sample-Handling Innovation.

Introduction

Urs Wuest is an inventor associated with Mettler-Toledo GmbH and based in Hombrechtikon, Switzerland. His patent work concerns sample handling and systems used in thermomechanical analysis.

Latest Patents

The supplied information lists 1 patent for Wuest: “Sample Carrier, Sample Storages, Lifting Forks and Related Systems for Sample Handling and Performing Thermomechanical Analysis of a Sample.”

The invention describes a sample carrier with a bottom, an upward-extending side wall, a contact face for receiving a sample, and a circumferential rim. The carrier is designed to work with a counterpart support element and sample storage units. Multiple storage units can be assembled into rails and placed on shelves. In a thermomechanical analysis system, samples held in the carriers can be transported from storage to a sample support using the counterpart support element.

Career Highlights

Wuest’s listed patent reflects work on coordinating sample carriers, storage arrangements, and transport mechanisms for laboratory analysis. The design brings together sample containment and automated handling within a system for thermomechanical testing.

Collaborations

The supplied information identifies Urs Joerimann and Samuel Keller as Wuest’s coworkers. It does not specify their roles in the patent or the extent of their collaboration.

Conclusion

Urs Wuest’s listed invention focuses on an integrated approach to storing, transporting, and supporting samples for thermomechanical analysis.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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