Petach-Tikva, Israel

Uri Agam

This inventor holds 1 USPTO granted patent. Top assignee: Alliedsignal Inc.. Active years: 2000.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Uri Agam. Retrieved from https://idiyas.com/inventor/uri-agam-bvrkl4o8

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2000

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1 patent (USPTO):Explore Patents

Title: The Innovations of Uri Agam

Introduction

Uri Agam is a notable inventor based in Petach Tikvah, Israel. He has made significant contributions to the field of imaging systems through his innovative work. With a focus on enhancing performance and correcting deficiencies in scanning technology, Agam's inventions have the potential to impact various applications.

Latest Patents

Uri Agam holds a patent for a dynamic optical scanning correction device. This invention involves a microscanner that is cascaded with electromechanical scanners in imaging systems. The purpose of this technology is to enhance performance and correct inherent deficiencies in both the scanning process and the displayed imagery. He has 1 patent to his name, showcasing his commitment to innovation.

Career Highlights

Agam is currently employed at AlliedSignal Inc., where he continues to develop and refine his inventions. His work at the company has allowed him to collaborate with other talented professionals in the field.

Collaborations

Some of his notable coworkers include Hubert Caron and Zvika Afik. Their combined expertise contributes to the advancement of technology in imaging systems.

Conclusion

Uri Agam's contributions to the field of imaging technology through his innovative patent demonstrate his dedication to enhancing performance in this area. His work continues to influence the development of advanced imaging systems.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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