This inventor holds 1 USPTO granted patent. Top assignee: Carl Zeiss Microimaging Gmbh. Active years: 2009.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2009
Title: Ulrich Zeh - Innovator in Spectrometry Technology
Introduction
Ulrich Zeh is a notable inventor based in Jena, Germany. He has made significant contributions to the field of spectrometry, particularly in the area of temperature compensation for detectors. His innovative approach has led to advancements that enhance the accuracy and reliability of spectrometric measurements.
Latest Patents
Ulrich Zeh holds a patent for an "Arrangement and method for compensation of the temperature dependency of detectors in spectrometers." This invention addresses the challenges posed by temperature variations that can affect detector performance. The arrangement includes an illumination unit, an entrance slit, an imaging grating, a detector, and a controlling and evaluating unit. By incorporating a second temperature gauge for ambient temperature, the invention ensures that the detector temperature remains constant, thereby improving measurement stability.
Career Highlights
Ulrich Zeh is associated with Carl Zeiss Microimaging GmbH, a leading company in optical and imaging technology. His work at this esteemed organization has allowed him to focus on developing innovative solutions that enhance the functionality of spectrometers. His dedication to research and development has positioned him as a key figure in his field.
Collaborations
Ulrich Zeh has collaborated with Felix Kerstan, contributing to the advancement of spectrometry technology. Their partnership has fostered innovation and has led to the successful development of new methodologies in the field.
Conclusion
Ulrich Zeh's contributions to spectrometry through his innovative patent demonstrate his commitment to improving scientific measurement techniques. His work continues to influence the industry and enhance the capabilities of spectrometers.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
