Lorrach, Germany

Ulrich Leisinger

This inventor holds 1 USPTO granted patent. Top assignee: Endress+hauser Gmbh+co.. Active years: 1997.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Ulrich Leisinger. Retrieved from https://idiyas.com/inventor/ulrich-leisinger

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 1997

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1 patent (USPTO):Explore Patents

Title: Ulrich Leisinger: Innovator in Radiation Measurement Technology

Introduction

Ulrich Leisinger is a notable inventor based in Lorrach, Germany. He has made significant contributions to the field of radiation measurement technology. His innovative approach addresses critical challenges in accurately measuring radiation levels.

Latest Patents

Leisinger holds a patent for a method of suppressing extraneous radiation effects in radioactive measurements. This invention relates to a technique that compensates for extraneous radiation caused by intermittent active radiation sources. The method involves determining the commencement and termination of extraneous radiation, as well as achieving a stable condition. By calculating the difference between measured values before and after the extraneous radiation, the method effectively reduces errors in radiation measurements.

Career Highlights

Ulrich Leisinger is associated with Endress+Hauser GmbH+Co. He has dedicated his career to advancing technologies that enhance the accuracy of radiation measurement. His work has been instrumental in improving the reliability of data in various applications.

Collaborations

Leisinger collaborates with Joachim Neuhaus, contributing to the development of innovative solutions in their field. Their partnership exemplifies the importance of teamwork in driving technological advancements.

Conclusion

Ulrich Leisinger's contributions to radiation measurement technology highlight his innovative spirit and dedication to improving measurement accuracy. His patent reflects a significant advancement in the field, showcasing his expertise and commitment to excellence.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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