Bergisch Gladbach, Germany

Ulrich Glombitza

This inventor holds 1 USPTO granted patent and 2 EPO patents. Top assignee: Lios Technology Gmbh. Active years: 2010.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Ulrich Glombitza. Retrieved from https://idiyas.com/inventor/ulrich-glombitza-l9m1hvm7

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

 

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 28(Granted Patents)


Company Filing History:


Years Active: 2010

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1 patent (USPTO):Explore Patents

Title: Ulrich Glombitza: Innovator in Optical Measurement Systems

Introduction

Ulrich Glombitza is a notable inventor based in Bergisch Gladbach, Germany. He has made significant contributions to the field of optical measurement systems, particularly through his innovative patent that enhances measurement precision.

Latest Patents

Ulrich Glombitza holds a patent for a method of calibrating an optical FMCW backscattering measurement system. This invention aims to improve the precision of measurements by converting received sensor signals into complex electrical signals, performing transformations to derive backscattering signals, and correcting these signals based on predetermined dependencies. His patent is a testament to his expertise in optical technologies and measurement systems.

Career Highlights

Throughout his career, Ulrich has worked with various companies, including Lios Technology GmbH and his own venture, Glombitza, Ulrich. His experience in these organizations has allowed him to develop and refine his skills in optical measurement technologies.

Collaborations

Ulrich has collaborated with professionals in his field, including Martin Fromme, which has further enriched his work and contributions to optical measurement systems.

Conclusion

Ulrich Glombitza's innovative work in calibrating optical measurement systems showcases his dedication to enhancing precision in technology. His contributions are valuable to the field and reflect his expertise as an inventor.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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