Stuttgart, Germany

Ulrich Balbach

This inventor holds 1 USPTO granted patent. Top assignee: Leuze Electronic Gmbh + Co Kg. Active years: 2019.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Ulrich Balbach. Retrieved from https://idiyas.com/inventor/ulrich-balbach

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 1.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2019

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1 patent (USPTO):Explore Patents

Title: Ulrich Balbach: Innovator in Object Detection Technology

Introduction

Ulrich Balbach is a notable inventor based in Stuttgart, Germany. He has made significant contributions to the field of sensor technology, particularly in the area of object detection. His innovative approach has led to the development of a unique safety sensor that enhances monitoring capabilities.

Latest Patents

Ulrich Balbach holds a patent for a "Sensor for detecting objects in a monitoring area." This invention features a display unit composed of a series of lamps arranged in a linear format. The lamps rotate around an axis parallel to their longitudinal axis at a specific speed. The control unit manages the display of a matrix-type display field, ensuring that the columns are presented sequentially to create a cohesive standing image. This technology is particularly valuable in safety applications.

Career Highlights

Ulrich Balbach is associated with Leuze Electronic GmbH + Co. KG, a company renowned for its advancements in automation and sensor technology. His work at Leuze has allowed him to focus on developing innovative solutions that improve safety and efficiency in various monitoring environments.

Conclusion

Ulrich Balbach's contributions to sensor technology exemplify the impact of innovation in enhancing safety measures. His patent for an advanced object detection sensor showcases his commitment to improving monitoring systems.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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