Company Filing History:
Years Active: 2009-2011
Title: Innovations by Uki Kabasawa
Introduction
Uki Kabasawa is a notable inventor based in Hitachinaka, Japan. He has made significant contributions to the field of charged particle apparatus, particularly in the area of sample preparation and observation techniques. With a total of 2 patents to his name, Kabasawa's work has advanced the capabilities of scanning electron microscopy (SEM).
Latest Patents
Kabasawa's latest patents focus on methods for sample preparation and observation using charged particle apparatus. His innovative approach addresses the challenges faced during SEM observation in the depth direction of a cross-section processed by repeated focused ion beam (FIB) cross-sectioning. The patents detail a method to correct deviations in the observation field of view and focus, which occur when the processed cross-section moves in the depth direction. By calculating information on the height and tilt of the surface of the cross-section processing area before processing, Kabasawa's methods predict the deviations in the field of view and focus during SEM observation. This predictive control enhances the accuracy and reliability of the SEM.
Career Highlights
Kabasawa is currently employed at Hitachi High-Technologies Corporation, where he continues to develop innovative technologies in the field of electron microscopy. His work has been instrumental in improving the precision of sample observations, which is crucial for various scientific and industrial applications.
Collaborations
Throughout his career, Kabasawa has collaborated with esteemed colleagues, including Tohru Ishitani and Tsuyoshi Ohnishi. These collaborations have fostered a productive environment for innovation and have contributed to the advancement of their shared field.
Conclusion
Uki Kabasawa's contributions to the field of charged particle apparatus and his innovative patents have significantly impacted the realm of electron microscopy. His work continues to inspire advancements in technology and research methodologies.