Tokyo, Japan

Uiko Morimoto

This inventor holds 1 USPTO granted patent. Top assignee: Nec Corporation. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Uiko Morimoto. Retrieved from https://idiyas.com/inventor/uiko-morimoto

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Uiko Morimoto and Privacy-Conscious ATM Event Detection.

Introduction

Uiko Morimoto is an inventor associated with NEC Corporation in Tokyo, Japan. Her patent work describes a system designed to detect potentially problematic events at ATMs while helping protect people’s privacy.

Latest Patents

The provided information lists 1 patent for Morimoto: “Event Detection System, Event Detection Method, and Non-Transitory Computer Readable Medium.” The invention compares skeletal information extracted from an image of a person visiting an ATM with registered skeletal information representing a phone-call action. When the similarity reaches a predetermined threshold, the system determines that an ATM-related event has occurred. This approach aims to support event detection without relying on identifying personal details.

Career Highlights

Morimoto’s listed patent reflects work on applying image analysis and skeletal information to ATM security. The patent describes a calculation unit for measuring similarity and a determination unit for identifying a possible event based on a threshold.

Collaborations

The provided information names Jianquan Liu and Noboru Yoshida as Morimoto’s coworkers. Their specific roles in the patent or related work are not stated.

Conclusion

Uiko Morimoto’s listed invention combines skeletal-information analysis with threshold-based detection to identify potential ATM events while emphasizing privacy.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…